Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions
Creators
- 1. Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Building 200, Argonne, IL 60439 (United States)
- 2. Universitaet Duisburg-Essen, Campus Duisburg, Lotharstr. 1, 47078 Duisburg (Germany)
Description
A new generation of secondary neutral mass spectrometry (SNMS) instruments has been developed that is especially designed for laser post-ionization (LPI). These instruments combine high useful yield and high background discrimination. Results presented here demonstrate that these instruments can detect one in every four atoms removed from a samples surface - a greater than one order of magnitude improvement over current large frame secondary ion mass spectrometry instruments. Because of their high sensitivity, these new LPI-SNMS instruments are especially amenable to analysis of samples of limited size and rare one-of-a-kind samples. Such an application is analysis of samples returned to Earth from space by the Genesis and Stardust Discovery missions of NASA
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.07.041;
- PII
- S0168-583X(05)01236-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 241
- Journal Issue
- 1-4
- Journal Page Range
- p. 356-360
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on the application of accelerators in research and industry
- Acronym
- CAARI 2004
- Dates
- 10-15 Oct 2004
- Place
- Fort Worth, TX (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37065796
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; IONIZATION; LASERS; MASS SPECTROMETERS; MASS SPECTROSCOPY; SENSITIVITY; SPACE; SURFACES
- Descriptors DEC
- MEASURING INSTRUMENTS; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.