Published December 2005 | Version v1
Journal article

Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions

  • 1. Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Building 200, Argonne, IL 60439 (United States)
  • 2. Universitaet Duisburg-Essen, Campus Duisburg, Lotharstr. 1, 47078 Duisburg (Germany)

Description

A new generation of secondary neutral mass spectrometry (SNMS) instruments has been developed that is especially designed for laser post-ionization (LPI). These instruments combine high useful yield and high background discrimination. Results presented here demonstrate that these instruments can detect one in every four atoms removed from a samples surface - a greater than one order of magnitude improvement over current large frame secondary ion mass spectrometry instruments. Because of their high sensitivity, these new LPI-SNMS instruments are especially amenable to analysis of samples of limited size and rare one-of-a-kind samples. Such an application is analysis of samples returned to Earth from space by the Genesis and Stardust Discovery missions of NASA

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.07.041;
PII
S0168-583X(05)01236-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
241
Journal Issue
1-4
Journal Page Range
p. 356-360
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
18. international conference on the application of accelerators in research and industry
Acronym
CAARI 2004
Dates
10-15 Oct 2004
Place
Fort Worth, TX (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37065796
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; IONIZATION; LASERS; MASS SPECTROMETERS; MASS SPECTROSCOPY; SENSITIVITY; SPACE; SURFACES
Descriptors DEC
MEASURING INSTRUMENTS; SPECTROMETERS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.