Published April 1997 | Version v1
Miscellaneous Open

The investigation of properties of neutron-doped silicon with manganese admixture

  • 1. Tashkentskij Gosudarstvennyj Univ., Tashkent (Uzbekistan). Nauchno-Issledovatel'skij Inst. Prikladnoj

Description

Short communication

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Part of:
Abstracts of the international conference on actual problems of physics of semiconductor devices

Additional details

Additional titles

Original title (Russian)
Исследование свойств нейтронно-легированного кремния c примесью марганца

Publishing Information

Imprint Title
Abstracts of the international conference on actual problems of physics of semiconductor devices
Imprint Pagination
131 p.
Journal Page Range
p. 6.
Report number
INIS-UZ--039

Conference

Title
International conference on actual problems of physics of semiconductor devices.
Dates
24-26 Apr 1997.
Place
Tashkent (Uzbekistan).

INIS

Country of Publication
Uzbekistan
Country of Input or Organization
Uzbekistan
INIS RN
28041149
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
CRYSTAL DOPING; ENERGY GAP; ENERGY LEVELS; MANGANESE; NEUTRON FLUENCE; PHOTOELECTRIC EFFECT; PHYSICAL RADIATION EFFECTS; SILICON; TRANSMUTATION
Descriptors DEC
ELEMENTS; METALS; RADIATION EFFECTS; SEMIMETALS; TRANSITION ELEMENTS

Optional Information

Notes
Imprint:Sbornik trudov mezhdunarodnoj konferentsii 'Aktual'nye problemy fiziki poluprovodnikovykh priborov'.