Published July 2, 2014 | Version v1
Journal article

Hard x-ray nanofocusing by multilayer Laue lenses

  • 1. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973 (United States)

Description

Multilayer Laue lens (MLL) is a new class of x-ray optics that offer great promise for achieving nanometre-level spatial resolution by focusing hard x-rays. Fabricating an MLL via thin-film deposition provides the means to achieve a linear Fresnel-zone plate structure with zone widths below 1 nm, while retaining a virtually limitless aspect ratio. Despite its similarity to the Fresnel-zone plate, MLL exhibits categorically distinctive focusing properties and their fabrication comes with a wide array of challenges. This article provides a comprehensive review of advances in MLLs, and includes extensive theoretical modelling on focusing performance, discussion on fabrication challenges, their current capabilities and notable results from x-ray focusing experiments. (topical review)

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/47/26/263001

Additional details

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
47
Journal Issue
26
Journal Page Range
[31 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46038971
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
DEPOSITION; EXPERIMENTAL DATA; FOCUSING; HARD X RADIATION; LAUE METHOD; LAYERS; LENSES; NANOSTRUCTURES; OPTICS; PLATES; REVIEWS; SPATIAL RESOLUTION; THIN FILMS
Descriptors DEC
DATA; DIFFRACTION METHODS; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; FILMS; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; RADIATIONS; RESOLUTION; X RADIATION