Hard x-ray nanofocusing by multilayer Laue lenses
- 1. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973 (United States)
Description
Multilayer Laue lens (MLL) is a new class of x-ray optics that offer great promise for achieving nanometre-level spatial resolution by focusing hard x-rays. Fabricating an MLL via thin-film deposition provides the means to achieve a linear Fresnel-zone plate structure with zone widths below 1 nm, while retaining a virtually limitless aspect ratio. Despite its similarity to the Fresnel-zone plate, MLL exhibits categorically distinctive focusing properties and their fabrication comes with a wide array of challenges. This article provides a comprehensive review of advances in MLLs, and includes extensive theoretical modelling on focusing performance, discussion on fabrication challenges, their current capabilities and notable results from x-ray focusing experiments. (topical review)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/47/26/263001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 47
- Journal Issue
- 26
- Journal Page Range
- [31 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46038971
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- DEPOSITION; EXPERIMENTAL DATA; FOCUSING; HARD X RADIATION; LAUE METHOD; LAYERS; LENSES; NANOSTRUCTURES; OPTICS; PLATES; REVIEWS; SPATIAL RESOLUTION; THIN FILMS
- Descriptors DEC
- DATA; DIFFRACTION METHODS; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; FILMS; INFORMATION; IONIZING RADIATIONS; NUMERICAL DATA; RADIATIONS; RESOLUTION; X RADIATION