Traveling DC-SQUID gradiometry for nondestructive evaluation
- 1. R and D Center, Tohoku Electric Power Co., Inc. 7-2-1 Nakayama 7-chome, Aoba-ku, Sendai 981-0952 (Japan)
- 2. SII NanoTechnology Inc. 1-8 Nakase, Mihama-ku, Chiba 261-8507 (Japan)
Description
We are reporting on the development of a self-propelled-type superconducting quantum interference device (SQUID) magnetic imaging system for nondestructive evaluation (NDE). We recently completed a novel SQUID instrument that can continuously travel back and forth by itself over the surface of sample during testing without using a magnetic shielding. Technically self-propelling is useful for enlarging an available scanning area of SQUID-NDE without limitation. The capability of the new SQUID instrument is strikingly demonstrated by the detection of weak ferromagnetism due to plastic deformation using type-304 austenitic stainless steels. The instrument is also useful in the evaluation of internal cracks artificially embedded in austenitic weld
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2004.10.016;
- PII
- S0921-4534(04)01318-8;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 418
- Journal Issue
- 1-2
- Journal Page Range
- p. 1-8
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36074935
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUSTENITIC STEELS; CRACKS; DEFORMATION; DETECTION; EVALUATION; FERROMAGNETISM; MAGNETIC SHIELDING; NONDESTRUCTIVE ANALYSIS; PLASTICS; SQUID DEVICES; SURFACES; TESTING; WELDED JOINTS
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CHEMICAL ANALYSIS; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; IRON ALLOYS; IRON BASE ALLOYS; JOINTS; MAGNETISM; MATERIALS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; SHIELDING; STEELS; SUPERCONDUCTING DEVICES; SYNTHETIC MATERIALS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.