Application of SnO2 nanoparticle as sulfide gas sensor using UV/VIS/NIR spectrophotometer
Creators
- 1. Department of Chemistry, Faculty of Mathematics and Natural Sciences Bandung Institute of Technology, Jl. Ganesha No 10, Bandung (Indonesia)
Description
Sulfide gas monitoring is required to protect organisms from its toxicity. Nanoparticles of metal oxides have characteristics that applicable as sensors for controlling environmental pollution like sulfide gas. Thin film of SnO2 as one part of the sulfide gas sensor was synthesized with the chemical liquid deposition method, and characterized by UV/VIS/NIR-Spectrophotometer before and after gas application, also using FTIR, SEM and XRD. Characterization studies showed nanoparticle sizes from the diameters range of 38-71 nm. Application of SnO2 thin film to sulfide gas detected by UV/VIS/NIR Spectrophotometer with diffuse reflectance showed chemical reaction by the shifting of maximum % R peak at wavelength of 1428 cm. The benefit of measurement of sulfide gas using this SnO2 nano thin film is that it could be done at the room temperature. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/188/1/012025Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 188
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1757-899X
Conference
- Title
- International symposium on current progress in functional materials
- Dates
- 26-27 Jul 2016
- Place
- Bali (Indonesia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49082003
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITION; FOURIER TRANSFORMATION; INFRARED SPECTRA; METALS; NANOPARTICLES; POLLUTION; SCANNING ELECTRON MICROSCOPY; SENSORS; SPECTROPHOTOMETERS; SULFIDES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TIN OXIDES; TOXICITY; WAVELENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; INTEGRAL TRANSFORMATIONS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLES; SCATTERING; SPECTRA; SULFUR COMPOUNDS; TEMPERATURE RANGE; TIN COMPOUNDS; TRANSFORMATIONS