Published 1989
| Version v1
Book
The Compton backscatter technique
Description
This paper outlines the purpose of the Compton backscatter technique and some of its applications. Although the idea of using the Compton effect for imaging employed in non-destructive testing of materials is relatively old, it is only recently that an embodiment enabling cost-effective inspection has been developed. (author). 2 refs.; 4 figs
Additional details
Additional titles
- Subtitle (English)
- A new method of X-ray inspection
Publishing Information
- Publisher
- Elsevier.
- Imprint Place
- Amsterdam (Netherlands)
- ISBN
- 0-444-87450
- Imprint Title
- Non-destructive testing. Volume 1
- Imprint Pagination
- 916 p.
- Journal Page Range
- p. 31-36.
Conference
- Title
- 12. World conference on non-destructive testing.
- Dates
- 23 Apr 1989.
- Place
- Amsterdam (Netherlands).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 20074613
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKSCATTERING; COMPTON EFFECT; NONDESTRUCTIVE TESTING; X-RAY RADIOGRAPHY
- Descriptors DEC
- BASIC INTERACTIONS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; MATERIALS TESTING; SCATTERING; TESTING
Optional Information
- Notes
- Imprint:Includes subject indexes and author index.