Published December 1992
| Version v1
Journal article
X-ray fluorescence analysis technique for determination of chemical composition of Zn - Se compounds and its thin layers on different plates
- 1. AN RU, Tashkent (Uzbekistan). Inst. Yadernoj Fiziki
Description
X -ray fluorescence analysis technique was elaborated for determination of chemical composition of Zn - Se massive samples and its thin layers on silicon and gallium arsenides plates.The equation with empiric coefficients has been reduced for the determination of ratio of characteristic radiations of selenium and zinc and on its basis the calibration dependence was constructed. The relative standard deviation of determination of zinc and selenium content is 0,004. (author). 6 refs., 2 figs
Additional details
Publishing Information
- Journal Title
- Uzbekiston Fizika Zhurnali
- Journal Volume
- 5
- Journal Page Range
- p. 90-93.
- ISSN
- 1025-8817
- CODEN
- UFZHEX
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 28027335
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- GALLIUM ARSENIDES; MULTI-ELEMENT ANALYSIS; SELENIUM; SILICON; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS; ZINC
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CHEMICAL ANALYSIS; ELEMENTS; FILMS; GALLIUM COMPOUNDS; METALS; NONDESTRUCTIVE ANALYSIS; PNICTIDES; SEMIMETALS; X-RAY EMISSION ANALYSIS