Published January 30, 2001
| Version v1
Journal article
Optical frequency metrology and its contribution to the determination of fundamental constants
- 1. Max-Planck-Institut fuer Quantenoptik, Hans-Kopfermann-Strasse 1, D-85748 Garching (Germany)
Description
Optical frequency metrology plays an important role for the determination of the Rydberg constant and offers an alternative way to determine the fine structure constant α. We have developed a new technique for measuring optical frequencies using femtosecond light pulses culminating in the single laser optical frequency synthesizer. This new technique greatly simplifies the task of measuring optical frequencies
Additional details
Identifiers
- DOI
- 10.1063/1.1354339;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 551
- Journal Issue
- 1
- Journal Page Range
- p. 58-72
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 17. international conference on atomic physics
- Acronym
- ICAP 2000
- Dates
- 4-9 Jun 2000
- Place
- Florence (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35076039
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FINE STRUCTURE; FREQUENCY MEASUREMENT; FUNDAMENTAL CONSTANTS; LASERS; MODE LOCKING; VISIBLE RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; RADIATIONS
Optional Information
- Notes
- (c) 2001 American Institute of Physics.