Published June 15, 2009 | Version v1
Journal article Metadata-only

Investigation of chemical phase formation in the ternary system beryllium, carbon and tungsten with depth-resolved photoelectron spectroscopy

Creators

  • 1. Max-Planck-Institut fuer Plasmaphysik, EURATOM Association, Boltzmannstrasse 2, 85748 Garching (Germany)

Description

Synchrotron radiation XPS with different photon energies is used to gain depth-resolved chemical information. The temperature-dependent evolution of a ternary system sample with beryllium, carbon and tungsten is investigated. Five temperature steps are performed in order to analyze the kinetic processes and chemical states, namely 300, 530, 850, 1020 and 1200 K. After each temperature treatment, the sample composition is analyzed using four different information depths.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2009.01.251

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2009.01.251;
PII
S0022-3115(09)00277-3;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
390-391
Journal Page Range
p. 975-978
ISSN
0022-3115
CODEN
JNUMAM

Conference

Title
18. international conference on plasma-surface interactions in controlled fusion device
Dates
26-30 May 2008
Place
Toledo, Castilla-La Mancha (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41077373
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BERYLLIUM; CARBON; CHEMICAL STATE; PHOTONS; SYNCHROTRON RADIATION; TEMPERATURE DEPENDENCE; TUNGSTEN; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
ALKALINE EARTH METALS; BOSONS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; MASSLESS PARTICLES; METALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; REFRACTORY METALS; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.