Published March 2010
| Version v1
Journal article
Investigation of diluted magnetic semiconductor and nano magnetic material by ion beam technology
- 1. State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing (China)
Description
In this paper, we focus on constitution, magnetism modification and characterization of GaN-based materials using ion beam technology and formation of the nano structure by implanting Mn+ or Co+ ion of different doses into the film samples. SQUID and AGM were used to measure the magnetic properties, such as coercivity and saturation magnetization, for the samples before and after annealing, M-H and M-T curves showed ferromagnetism in the films at both low temperature and room temperature. RBS/C, PIXE and XRD were used to analyze the microstructure, content of doping transition metal and damage. The nano-cluster of ferromagnetism particle was observed under HRTEM. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 33
- Journal Issue
- 3
- Journal Page Range
- p. 173-178
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 42093585
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; COBALT IONS; FERROMAGNETISM; FILMS; GALLIUM NITRIDES; ION BEAMS; ION IMPLANTATION; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MAGNETIZATION; MANGANESE IONS; MICROSTRUCTURE; NANOSTRUCTURES; NICKEL IONS; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SQUID DEVICES; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; TRANSITION ELEMENTS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; GALLIUM COMPOUNDS; HEAT TREATMENTS; IONS; MAGNETISM; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE; X-RAY EMISSION ANALYSIS; ZINC COMPOUNDS
Optional Information
- Notes
- 6 figs., 4 tabs., 10 refs.