Published January 2010 | Version v1
Journal article

A first-principles study on the lower-valence coexisting Cr2TiX (X=Al, Ga, Si, Ge, Sn, Sb) Heusler alloys

  • 1. School of Materials Science and Engineering, Hebei University of Technology, Tianjin 300130 (China)

Description

The electronic, magnetic, and bonding properties of the Cr2TiX (X=Al, Ga, Si, Ge, Sn, Sb) Heusler alloys have been investigated using first-principles calculations. The results show that Cr2TiSb exhibits a half-metallic nature and Cr2TiGa and Cr2TiSn exhibit a nearly half-metallic nature. From analysis of the density of states and the electron density difference along the Ga→Sn→Sb series for sp atoms, we found that the Cr-Ti bond demonstrates covalent character with more or less the ionic and metallic nature. In addition, the Cr-Ti bonding strength increases along this series. All the compounds have a negative total magnetic moment, most of which are confined to the Cr atoms. There exists a 1.0μB increasing trend of the total moment along the III→IV→V main group for sp atoms, and only the total moment of Cr2TiSb coincides well with the Slater-Pauling behavior.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2009.07.048

Additional details

Identifiers

DOI
10.1016/j.jmmm.2009.07.048;
PII
S0304-8853(09)00767-7;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
322
Journal Issue
1
Journal Page Range
p. 1-6
ISSN
0304-8853
CODEN
JMMMDC

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41088873
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMS; BONDING; DENSITY; ELECTRON DENSITY; FERROMAGNETISM; HEUSLER ALLOYS; MAGNETIC MOMENTS; VALENCE
Descriptors DEC
ALLOYS; ALUMINIUM ALLOYS; COPPER ALLOYS; COPPER BASE ALLOYS; CORROSION RESISTANT ALLOYS; FABRICATION; JOINING; MAGNETISM; MANGANESE ALLOYS; PHYSICAL PROPERTIES; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.