Published March 1, 2013 | Version v1
Journal article

Effects of magnetic flux density and substrate temperature on Ni films prepared by means of unbalanced magnetron sputtering assisted by inductively coupled plasma

  • 1. Graduate School of Science and Technology, Hiroshima Institute of Technology, Hiroshima 731-5193 (Japan)

Description

We prepared Ni films on glass substrates by means of Unbalanced Magnetron Sputtering Assisted by Inductively Coupled Plasma (UM-ICP). The effects of the magnetic flux density BC and the substrate temperature TS on their structures were investigated. We found that the surface grain size observed with an atomic force microscope became large as BC and TS increase. We also found that the (111) plane measured by X-ray diffraction was preferentially orientated on the films under BC=5 mT at TS=60°C. These indicate that the energetic particle bombardment under BC and the increase of TS promote the surface diffusion on the Ni films. The ferromagnetic domain patterns observed with a magnetic force microscope showed the stripe domain structure having the domain width increasing with increasing TS and the fractal dimension of 1.88.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/417/1/012035

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
417
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1742-6596

Conference

Title
15. international conference on thin films
Acronym
ICTF-15
Dates
8-11 Nov 2011
Place
Kyoto (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44068222
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DIFFUSION; DOMAIN STRUCTURE; FLUX DENSITY; GLASS; GRAIN SIZE; MAGNETIC FLUX; MAGNETRONS; PLASMA; SPUTTERING; SURFACES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SCATTERING; SIZE