Study of radiation induced electrical degradation of alumina in a dynamic pumping condition in a fission reactor
Creators
- 1. Tohoku Univ., Oarai, Ibaraki (Japan). Oarai Branch, Inst. for Materials Research
Description
The electrical conductivity of two ceramic insulators, alumina, and silicon nitride was measured in a fission reactor, JMTR under a dynamic vacuum condition. The instrumented irradiation rig was dynamically evacuated during fission reactor operation. The uppermost vacuum level attained was better than 10-2 Torr. In this experiment, we attempted to reveal effects of the gaseous environment on the measurement of electrical conductivity under ionizing irradiation. The results showed that the gaseous environment has a most hazardous effect in a certain gas pressure range. In the second experiment, an electrical resistivity of polycrystal α-alumina was measured at about 680K in a dynamic pumping condition. In a good vacuum, we observed smaller RIC(radiation induced conductivity) than our previous results. We observed RIED(radiation induced electrical degradation)-like behavior. The results suggested that RIED would take off faster at a higher ionizing dose rate. In the meantime, the take-off occurred at about the same displacement damage of about 0.03-0.05 dpa in the range of fast neutron flux of 3.4-15.1x1013 n/cm2s. (author)
Additional details
Publishing Information
- Journal Title
- Science Reports of the Research Institutes, Tohoku University, Series A
- Journal Volume
- 40
- Journal Issue
- 1
- Journal Page Range
- p. 159-166.
- ISSN
- 0040-8808
- CODEN
- SRTAA6
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 26024024
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; COMPUTERIZED SIMULATION; DOSE RATES; DOSE-RESPONSE RELATIONSHIPS; ELECTRIC CONDUCTIVITY; ELECTRICAL INSULATORS; G CODES; NEUTRON BEAMS; PHYSICAL RADIATION EFFECTS; PRESSURE DEPENDENCE; SILICON NITRIDES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; COMPUTER CODES; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; NITRIDES; NITROGEN COMPOUNDS; NUCLEON BEAMS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHYSICAL PROPERTIES; PNICTIDES; RADIATION EFFECTS; SILICON COMPOUNDS; SIMULATION