Published April 1, 1997 | Version v1
Journal article

Proton radiation effects on SI LEC GaAs detector performances

  • 1. Istituto Nazionale di Fisica Nucleare, Bologna (Italy)
  • 2. Modena Univ. (Italy). Ist. di Fisica
  • 3. INFM, Modena (Italy)
  • 4. Dipartimento di Scienze dell'Ingegneria, Via Campi 213/B, I-41100 Modena (Italy)
  • 5. INFN, Trieste (Italy)
  • 6. Dipartimento di Fisica, Via della Scienze 208, I-33100 Udine (Italy)
  • 7. INFM, Bologna (Italy)
  • 8. Dipartimento di Fisica, Via Irnerio 46, I-40126 (Italy)
  • 9. CETME/ALENIA S.p.A., Roma (Italy)

Description

Semi-insulating GaAs detectors have been irradiated with 24 GeV/c protons with 3.87 and 5.6 x 1013 cm-2 doses. Both electron and hole lifetimes are affected by the radiation damage, the hole lifetime much more dramatically. Nevertheless, by operating at high reverse bias voltage (600 V), 70% of the alpha-particle-generated charge carriers are collected on average. A few traps for electrons (0.14 eV) and holes (0.54 eV) have been detected only in the irradiated detectors. These findings have been correlated to the performance of the irradiated GaAs detectors. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
388
Journal Issue
3
Journal Page Range
p. 379-382.
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
International conference on radiation effects on semiconductor materials, detectors and devices.
Dates
6-8 Mar 1996.
Place
Florence (Italy).