Published May 15, 2000 | Version v1
Journal article Metadata-only

Principal component analysis for soft x-ray spectromicroscopy

Creators

  • 1. X-ray Microscopy Group, Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, New York 11794-3800 (United States)

Description

A principal component analysis approach to extract thickness maps from spectromiscroscopic image stacks is described and illustrated with a model calculation

Additional details

Identifiers

DOI
10.1063/1.1291170;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 350-357
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35069977
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
IMAGE PROCESSING; IMAGES; MAPS; MATHEMATICAL MODELS; MICROSCOPY; SOFT X RADIATION; THICKNESS; X-RAY SPECTROSCOPY
Descriptors DEC
DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PROCESSING; RADIATIONS; SPECTROSCOPY; X RADIATION

Optional Information

Notes
(c) 2000 American Institute of Physics.