Photo-emission-electron-microscopy for characterization of an operating organic electronic device

Photoemission-electron-microscopy (PEEM) is introduced as a tool for the characterization of organic electronic devices. PEEM-measurements are used for imaging as well as for spectroscopic analyses by illumination with light of a Hg-lamp (4.9 eV), a D2 lamp (7.3 eV), and with synchrotron radiation for resonant photoelectron spectroscopy. We determine the charge carrier concentration inside the channel region of the organic device and its lateral distribution. From resonant photoelectron spectroscopy (RPES) we deduce the electronic states which are accessible with the Hg and D2 illumination. Photoelectron-spectroscopy at selected areas (μ-PES) gives information on the absolute values of surface potentials in lateral resolution. We are able to perform these studies with applied voltages at the source- and drain-electrode