Theoretical description of hopping transport in disordered materials
Creators
- 1. Department of Physics and Material Sciences Centre, Philipps University Marburg, D-35032 Marburg (Germany)
Description
Incoherent hopping conduction has been revealed as the electronic transport mechanism in lightly doped microcrystalline semiconductors at low temperatures. Although microcrystalline materials should be considered as geometrically inhomogeneous systems, essential features of the photoconductivity and dark conductivity in such systems can be successfully described by theoretical models based on a homogeneous distribution of localized states. We review several theoretical approaches suggested so far for the description of hopping transport in disordered materials. In order to verify the validity of analytical approaches, we have performed a series of straightforward computer simulations for the percolation problem in hopping conduction. The simulation results support the analytical approaches based on the transport energy concept and on percolation arguments for the description of the dark conductivity at low temperatures
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.01.025;
- PII
- S0040-6090(05)00045-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 487
- Journal Issue
- 1-2
- Journal Page Range
- p. 2-7
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- International conference on polycrystalline semiconductors - Materials, technologies, device applications
- Dates
- 5-10 Sep 2004
- Place
- Potsdam (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37019721
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGED-PARTICLE TRANSPORT; COMPUTERIZED SIMULATION; DISTRIBUTION; DOPED MATERIALS; PHOTOCONDUCTIVITY; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; RADIATION TRANSPORT; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.