Published September 1, 2005 | Version v1
Journal article

Theoretical description of hopping transport in disordered materials

  • 1. Department of Physics and Material Sciences Centre, Philipps University Marburg, D-35032 Marburg (Germany)

Description

Incoherent hopping conduction has been revealed as the electronic transport mechanism in lightly doped microcrystalline semiconductors at low temperatures. Although microcrystalline materials should be considered as geometrically inhomogeneous systems, essential features of the photoconductivity and dark conductivity in such systems can be successfully described by theoretical models based on a homogeneous distribution of localized states. We review several theoretical approaches suggested so far for the description of hopping transport in disordered materials. In order to verify the validity of analytical approaches, we have performed a series of straightforward computer simulations for the percolation problem in hopping conduction. The simulation results support the analytical approaches based on the transport energy concept and on percolation arguments for the description of the dark conductivity at low temperatures

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.01.025;
PII
S0040-6090(05)00045-3;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
487
Journal Issue
1-2
Journal Page Range
p. 2-7
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
International conference on polycrystalline semiconductors - Materials, technologies, device applications
Dates
5-10 Sep 2004
Place
Potsdam (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37019721
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGED-PARTICLE TRANSPORT; COMPUTERIZED SIMULATION; DISTRIBUTION; DOPED MATERIALS; PHOTOCONDUCTIVITY; SEMICONDUCTOR MATERIALS
Descriptors DEC
ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; RADIATION TRANSPORT; SIMULATION

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.