Continued skirmishing on the wave-particle frontier
Creators
- 1. Department of Physics, University of Cambridge, J.J. Thomson Avenue, Cambridge, CB3 0HE (United Kingdom)
Description
Highlights: • Waves and particles in electron microscopy. • Updating Richard Feynman. • Johnson noise stimulation of bremmstrahlung. -- Abstract: Historical developments in electron microscopy where understanding lies at the interface between the particle and wave pictures of the electron are reviewed. Electron optics has remained mainly particle-based but imaging is now substantially dependent on wave methods which are now pushing it to new heights. Spectroscopy in the low loss region has used Fermi's classical electron model which can also describe the main effects of Johnson noise. It is confirmed that the RMS Johnson noise scattering of an aloof beam electron is proportional to its wavelength and to the square root of the temperature. If the conductivity σ is high, it is independent of σ. In the performance of magnetic spectrometers, the angular deflections due to the walls may be less significant than that generated in the slits. The angular deflections due to the many bremmstrahlung events in the spectrometer seem to be negligible but the influence of Johnson noise on them is beyond the scope of the classical Fermi theory and will need to be addressed by the quantum mechanical spontaneous wave theory.
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2019.01.006;
- PII
- S0304399118302973;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 203
- Journal Page Range
- p. 52-59
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55050765
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON MICROSCOPY; ELECTRONS; MAGNETIC SPECTROMETERS; NOISE; OPTICS; QUANTUM MECHANICS; SCATTERING; SPECTROSCOPY; WAVELENGTHS
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MEASURING INSTRUMENTS; MECHANICS; MICROSCOPY; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.