Use of synchrotron radiation sources for X-ray diffraction topography of polytypic structures

The potential of synchrotron radiation sources (SRS) for the topography of polytypic structures has been assessed. Thus it has been found that the white radiation and low divergence characteristics of the SRS are uniquely suitable for accommodating the complications of mixed polytypes, heavily distorted crystals and edge-reflection topography. Computer aids are particularly important for separating contributions from mixed polytype crystals. All these techniques are illustrated in this paper using silicon carbide as a prototype polytypic crystal. (Auth.)