Arsenic overlayer on Si(111): Removal of surface reconstruction
- 1. Xerox Palo Alto Research Center, Palo Alto, CA 94304
Description
The sputtered and annealed (111) surface of silicon exhibits a strong 7 x 7 reconstruction. Evidence from a number of techniques shows that this large unit cell has a number of distinctly different surface atomic sites. The reconstruction of the surface is driven by a lowering of the energy of the dangling-bond orbitals, which are half-filled on the ideal surface. If the dangling bonds were to become saturated, the driving force for the reconstruction would be reduced, and a nearly ''ideal'' surface should result. This can be approximated by an As terminated surface, with As atoms substituting for the top atomic layer of Si. The As is then 3-fold coordinated, which it prefers, with 2 electrons in a ''lone-pair'' orbital. This model, with each Si second layer atom bonded to 3 As atoms above and one Si below, predicts the observed removal of the 7 x 7 reconstruction upon As exposure. It also predicts that the core-level spectra of the Si atoms should exhibit only one non-bulk site, well shifted from the bulk peak, as opposed to the many different sites for the 7 x 7 surface. This configuration has also been predicted and observed for the Ge(111) surface
Additional details
Publishing Information
- Publisher
- Stanford Synchrotron Radiation Laboratory.
- Imprint Place
- Stanford, CA (USA)
- Imprint Title
- Proceedings of the 12th annual users group meeting of the Stanford Synchrotron Radiation Laboratory
- Journal Page Range
- p. 24.
Conference
- Title
- 12. annual Synchrotron Radiation Lab Users Group meeting.
- Dates
- 24-25 Oct 1985.
- Place
- Stanford, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17087292
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; ARSENIC; ARSENIC ADDITIONS; CRYSTAL STRUCTURE; DEPOSITION; EMISSION SPECTROSCOPY; PHOTOEMISSION; SILICON; SPEAR; SURFACE COATING; SURFACE PROPERTIES; SYNCHROTRON RADIATION SOURCES; US DOE; VACUUM COATING
- Descriptors DEC
- ELEMENTS; EMISSION; NATIONAL ORGANIZATIONS; RADIATION SOURCES; SECONDARY EMISSION; SEMIMETALS; SPECTROSCOPY; STORAGE RINGS; US ORGANIZATIONS