The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy
- 1. Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602 (United States)
- 2. National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666 (United States)
- 3. EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430 (United States)
- 4. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332 (United States)
Description
Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. - Highlights: • The GND to SSD transition with increasing step size is analytically modeled. • Dislocation density of a microindented tantalum single crystal is measured. • Guidelines for step size selection in EBSD dislocation microscopy are presented.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.03.003Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.03.003;
- PII
- S0304-3991(16)30015-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 164
- Journal Page Range
- p. 1-10
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48021836
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; DENSITY; DISLOCATIONS; ELECTRON DIFFRACTION; FUNCTIONS; LENGTH; MONOCRYSTALS; RESOLUTION; TANTALUM
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; DIMENSIONS; ELEMENTS; LINE DEFECTS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.