Published May 2016 | Version v1
Journal article

The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy

  • 1. Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602 (United States)
  • 2. National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666 (United States)
  • 3. EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430 (United States)
  • 4. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332 (United States)

Description

Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. - Highlights: • The GND to SSD transition with increasing step size is analytically modeled. • Dislocation density of a microindented tantalum single crystal is measured. • Guidelines for step size selection in EBSD dislocation microscopy are presented.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.03.003

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.03.003;
PII
S0304-3991(16)30015-8;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
164
Journal Page Range
p. 1-10
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48021836
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BACKSCATTERING; DENSITY; DISLOCATIONS; ELECTRON DIFFRACTION; FUNCTIONS; LENGTH; MONOCRYSTALS; RESOLUTION; TANTALUM
Descriptors DEC
COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; DIMENSIONS; ELEMENTS; LINE DEFECTS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.