Published 1989 | Version v1
Book

Laser scatterometer

Description

The design concept and test performance of a laser scatterometer for the characterization of smooth optical surfaces are discussed. The fundamental principles of surface-roughness measurement are reviewed; the correction for back-surface scattering is explained; a diagram of the present experimental setup is presented; and results from successful test measurements on opaque and transparent samples are presented in a table

Additional details

Publishing Information

Publisher
Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
Imprint Title
Stray light and contamination in optical systems; Proceedings of the Meeting, San Diego, CA, Aug. 17-19, 1988
Imprint Pagination
342 p.
Journal Page Range
p. 192-196.

Conference

Title
Stray light and contamination in optical systems meeting.
Dates
17-19 Aug 1988.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21008076
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
LASERS; MEASURING INSTRUMENTS; OPACITY; PERFORMANCE TESTING; ROUGHNESS; SCATTERING; SPECIFICATIONS; SURFACE PROPERTIES
Descriptors DEC
AMPLIFIERS; EQUIPMENT; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; TESTING

Optional Information

Secondary number(s)
CONF-8808266--.