Transport of sputtered impurities in the vicinity of the TFTR inner bumper limiter

The generation and transport of metallic and carbon impurities on the inner bumper limiter of TFTR have been investigated in detail. The spatial profiles for impurity deposition and deposited layer thickness predicted by the analytical model are compared to the extensive post plasma exposure measurements of surface conditions that have been made on the TFTR inner bumper tiles. Agreement between the analytical model and the experimental data is good. The work provides considerable insight into the dynamics of particle transport in the edge region. 13 refs., 8 figs., 2 tabs