Published 1990
| Version v1
Book
Oxide films for the protection of cuprate superconductors
Creators
- 1. Dow Corning Corp., Midland, MI (United States)
- 2. Hughes Aircraft Co., Newport Beach, CA (United States)
Description
This paper reports on the cuprate superconductors that rapidly degrade in moisture and in the presence of organic compounds. A protection method has been developed with a coating process using sol/gel routes to the low temperature formation of oxide films. In contrast to traditional protective films amorphous silica films formed from a solution precursors gave excellent protection and caused little degradation of the superconductors. The protective abilities of the films were assessed by monitoring the degradation of Y1Ba2Cu3O7-d in the presence of 85% relative humidity at 85 C. Volume magnetic susceptibility, four-point probe resistivity, current density measurements and x-ray diffraction were performed
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-057-7
- Imprint Title
- High-temperature superconductors: Fundamental properties and novel materials processing
- Imprint Pagination
- 1322 p.
- Journal Page Range
- p. 1141-1144.
Conference
- Title
- Materials Research Society fall meeting.
- Dates
- 27 Nov - 2 Dec 1989.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23021498
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; BARIUM OXIDES; COPPER OXIDES; CURRENT DENSITY; FILMS; HUMIDITY; MAGNETIC SUSCEPTIBILITY; MATERIALS TESTING; ORGANIC COMPOUNDS; OXIDES; PROTECTIVE COATINGS; SILICON OXIDES; SOL-GEL PROCESS; SUPERCONDUCTIVITY; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COATINGS; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MAGNETIC PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; TESTING; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-891119--.