Exchange bias and interface structure in the Ni/NiO nanogranular system
- 1. Dipartimento di Fisica, Universita di Bologna and CNISM, Viale Berti Pichat 6/2, 40127 Bologna (Italy)
- 2. Dipartimento di Fisica, Universita di Ferrara and CNISM, Via Saragat 1, 44100 Ferrara (Italy)
- 3. ENEA, Dipartimento FIM, CR Casaccia, Via Anguillarese 301, 00123 Rome (Italy)
- 4. ENEA, Dipartimento FIM, CR Brindisi, SS 7 Appia, Km 706, 72100 Brindisi (Italy)
Description
The exchange bias (EB) effect has been studied in Ni/NiO nanogranular samples obtained by annealing in H2, at different temperatures (200 ≤ Tann ≤ 300 deg. C), NiO powder previously ball-milled for 20 h. Typically, the samples consist of Ni nanoparticles (mean size of 10-18 nm) embedded in a nanocrystalline NiO matrix. With increasing Tann, the Ni fraction varies from 4% up to 69%. The exchange field depends on the Ni amount, being maximum (∼600 Oe), at T = 5 K, in the sample with 15% Ni. In all the samples, the EB effect vanishes at T = 200 K. The structural features of the samples have been investigated by x-ray diffraction, electron microscopy and extended x-ray absorption fine structure and the low-temperature magneto-thermal behaviour has been thoroughly analyzed. The results show the existence of a structurally and magnetically disordered NiO component, which plays the key role in the EB mechanism
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/41/13/134008Additional details
Identifiers
- DOI
- 10.1088/0022-3727/41/13/134008;
- PII
- S0022-3727(08)66421-9;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 41
- Journal Issue
- 13
- Journal Page Range
- [7 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
Conference
- Title
- 6. international conference on fine particle magnetism (ICFPM)
- Dates
- 9-12 Oct 2007
- Place
- Rome (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40043217
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ANNEALING; CRYSTALS; ELECTRON MICROSCOPY; FINE STRUCTURE; NANOSTRUCTURES; NICKEL; NICKEL OXIDES; PARTICLES; POWDERS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; TIME DEPENDENCE; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SORPTION; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS