Performance of measuring equipment with semiconductor radiation detectors under fluctuation modes

Possibilities are considered of using a fluctuation method for measuring fluence and doses of ionizing radiations by semiconductor detectors. The method is based on determining a central moment other than 0, of random distribution of detector signal instantaneous values. It is shown that, with application of the DKD-G semiconductor diffusion drift Si-detector, the fluctuation method permits to take measurements in the 3x10-6 to 0.2 Gy/s range of dose rates, where pulsed and current methods cannot be practically used