Published July 6, 2011 | Version v1
Journal article

High-throughput characterization of the Seebeck coefficient of a-(Cr1-xSix)1-yOy thin film materials libraries as verification of the extended thermopower formula

  • 1. MEAS Deutschland GmbH, Hauert 13, D-44227 Dortmund (Germany)
  • 2. Institute of Materials Research, Linder Hoehe, 51147 Koeln (Germany)
  • 3. Institute for Materials, Ruhr-Universitaet Bochum, Universitaetsstrasse 150, 44801 Bochum (Germany)

Description

In a previous paper (Sonntag 2010 J. Phys.: Condens. Matter 22 235501) the classical thermopower formula has been argued to be incomplete, because it only takes into account the scattering properties of the carriers, but not the temperature dependence of the electrochemical potential μ caused by variation of the carrier density and/or band edge shift with temperature T. This argument is now checked experimentally by high-throughput measurements of the thermopower (Seebeck coefficient) S of a-(Cr1-xSix)1-yOy thin film materials libraries. The concentration dependences of S differ depending on whether the measurements are done with the complete film (where x ranges continuously from x∼0.3 to 0.8; y∼0.1-0.2) or with the separated pieces (each piece with another average value of x). These differences are especially large if, in addition, an oxygen gradient is present.

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/23/26/265501

Additional details

Identifiers

DOI
10.1088/0953-8984/23/26/265501;
PII
S0953-8984(11)89577-9;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
23
Journal Issue
26
Journal Page Range
[7 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43007434
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AMORPHOUS STATE; CARRIER DENSITY; CARRIERS; CHROMIUM COMPOUNDS; ELECTROCHEMISTRY; OXYGEN; OXYGEN COMPOUNDS; SCATTERING; SEEBECK EFFECT; SILICON COMPOUNDS; TEMPERATURE DEPENDENCE; THIN FILMS; VERIFICATION
Descriptors DEC
CHEMISTRY; ELEMENTS; FILMS; NONMETALS; TRANSITION ELEMENT COMPOUNDS