Plasma-surface interaction at sharp edges and corners during ion-assisted physical vapor deposition. Part I: Edge-related effects and their influence on coating morphology and composition
Creators
- 1. Material Research Institute, Sheffield Hallam University, S1 1WB Sheffield (United Kingdom)
Description
Ion-assisted physical vapor deposition (PVD) is a common industrial method for growing thin coatings of various interstitial nitride alloys. The interaction between the ions and three-dimensional nonflat samples during the deposition can, however, lead to unwanted local changes in the properties of the coating and thus its performance. We analyze the characteristics of the ion bombardment during ion-assisted PVD on sharp convex substrates and their effect on the growing coating. We show that the magnitude and the spatial extent of the edge-related changes are directly related to the characteristics of the plasma sheath around the biased edges. We examine the influence of the edge geometry and the deposition conditions. The edge-related effects are studied on the example of wedge-shaped samples coated with TiAlN/VN by closed-field unbalanced magnetron deposition process using high-flux low-energy Ar+-ion irradiation (Ji/Jme∼4, Ei=75-150 eV). The samples are analyzed by scanning electron microscopy and energy-dispersive x-ray spectroscopy. Significant changes in the morphology, thickness, and composition of the coatings are found in the edge region. In order to account for the changes, we apply a self-consistent model of the plasma sheath around wedge-shaped samples proposed by Watterson [J. Phys. D 22, 1300 (1989)], to our conditions. For a 30 deg. wedge coated at -150 V, the resputtering rate in the edge region is found to be increased by up to ten times as compared to flat substrate areas. The effect is due to the combined action of an increased ion flux and increased sputtering yield as a result of the nonperpendicular angle of incidence of ions in the edge region. The situation at sharp corners, where even more severe effects are observed, is analyzed and modeled in the companion article E. B. Macak et al., J. Appl. Phys. (2003) (Part II)
Additional details
Identifiers
- DOI
- 10.1063/1.1597755;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 94
- Journal Issue
- 5
- Journal Page Range
- p. 2829-2836
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35060447
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CHEMICAL ANALYSIS; COATINGS; INCIDENCE ANGLE; INTERSTITIALS; ION BEAMS; MAGNETRONS; MORPHOLOGY; PHYSICAL VAPOR DEPOSITION; PLASMA; PLASMA SHEATH; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACES; THICKNESS; TITANIUM ALLOYS; WALL EFFECTS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; DIMENSIONS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; POINT DEFECTS; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2003 American Institute of Physics.