Application of high-resolution TEM to ceramic science

Published 1977 | Version v1

Book Metadata-only

1. Case Western Reserve Univ., Cleveland, Ohio (USA). Dept. of Metallurgy and Materials Science

no abstract available

Additional details

Publisher: Institute of Physics.
Imprint Place: Bristol
ISBN: 0 85498 127 6
Imprint Title: Developments in electron microscopy and analysis, 1977. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held in Glasgow, 12-14 September 1977 (EMAG 77)
Journal Issue: no. 36
Series: Institute of Physics Conference Series.
Journal Page Range: p. 203-206.
ISSN: 0305-2346

Title: Institute of Physics Electron Microscopy and Analysis Group conference on developments in electron microscopy and analysis (EMAG 77).
Dates: 12 - 14 Sep 1977.
Place: Glasgow, UK.

Country of Publication: United Kingdom
Country of Input or Organization: United Kingdom
INIS RN: 9373300
Subject category: S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: ALUMINIUM OXIDES; CERAMICS; CRYSTAL LATTICES; CRYSTAL-PHASE TRANSFORMATIONS; DISLOCATIONS; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; HOT PRESSING; INTERSTITIALS; PHYSICAL RADIATION EFFECTS; SILICON CARBIDES; SILICON NITRIDES; SINTERING; SPATIAL RESOLUTION; ZIRCONIUM OXIDES
Descriptors DEC: ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; FABRICATION; LINE DEFECTS; MATERIALS WORKING; MICROSCOPY; MICROSTRUCTURE; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; POINT DEFECTS; PRESSING; RADIATION EFFECTS; RESOLUTION; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS