Published 1993 | Version v1
Book

Properties and structures of Fe-based metallic thin films in amorphous and crystalline forms

Creators

  • 1. Inst. fuer Technische Chemie, Aachen (Germany)

Description

A fundamental study has been conducted on Fe78B13Si9 metallic thin film in order to understand the change of the properties and structures of the film as a function of Cr and NiMo additions. The separate additions of Cr and Ni-Mo was successful in a way two new metallic thin films were produced. The composition of the new films are Fe77Cr2B16Si5 and Fe74Ni4 Mo3B17Si2. Therefore, the study was focused on evaluating the physical and magnetic properties of the films with respect to the Cr, and Ni-Mo additions. Furthermore, characterizations of the internal and surface structures of the films have been conducted by a Transmission Electron Microscope (TEM) and a Scanning Tunneling Microscope (STM), respectively. A comparison between the internal and surface structures of the films was carried out on both amorphous and crystallined forms. As a result, a correlation between the properties and structures of the films is established

Part of:
Spectroscopic characterization techniques for semiconductor technology IV

Additional details

Publishing Information

Publisher
SPIE--The International Society for Optical Engineering.
Imprint Place
Bellingham, WA (United States)
ISBN
0-8194-0839-5
Imprint Title
Spectroscopic characterization techniques for semiconductor technology IV
Imprint Pagination
317 p.
Journal Page Range
p. 32-44.

Conference

Title
physics toward device applications.
Acronym
Symposium on advances in semiconductors and superconductors
Dates
23-27 Mar 1992.
Place
Somerset, NJ (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25024886
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BORON ALLOYS; CHROMIUM ADDITIONS; CRYSTALS; IRON BASE ALLOYS; METALLIC GLASSES; MICROSCOPY; MOLECULAR STRUCTURE; MOLYBDENUM ADDITIONS; NICKEL ADDITIONS; PHASE STUDIES; PHYSICAL PROPERTIES; SILICON ALLOYS; THIN FILMS
Descriptors DEC
ALLOYS; FILMS; IRON ALLOYS

Optional Information

Secondary number(s)
CONF-920309--.