Published December 2008
| Version v1
Journal article
Preparation of TEM samples for hard ceramic powders
- 1. National Centre for HREM, Kavli Institute of Nanoscience, Delft University of Technology, 2628 CJ Lorentzweg 1, Delft (Netherlands)
Description
It is challenging to prepare a good sample for high-resolution electron microscopy of polycrystalline ceramic powders containing hard particles or particles with a strong preferential cleavage. Here we demonstrate that embedding the particles in a Cu matrix in a pressed pellet allows for straightforward conventional ion milling. The method is applied to powders of Mg10Ir19B16 and Na0.5CoO2 to show its feasibility, whereby transmission electron microscopy (TEM) samples with crystalline areas thinner than 10 nm can be obtained easily.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2008.07.002Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2008.07.002;
- PII
- S0304-3991(08)00192-7;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 109
- Journal Issue
- 1
- Journal Page Range
- p. 8-13
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009586
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; CLEAVAGE; IONS; MILLING; PARTICLES; PELLETS; POLYCRYSTALS; POWDERS; RESOLUTION; SAMPLE PREPARATION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; CRYSTALS; ELECTRON MICROSCOPY; MACHINING; MICROSCOPY; MICROSTRUCTURE
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.