Microwave reflectometry for fusion plasma diagnostics. Report on the IAEA Technical Committee Meeting held at Princeton Plasma Physics Laboratory, Princeton University, Princeton, New Jersey, United States of America, 25-27 January 1994
Description
The second Workshop on reflectometry for fusion plasma diagnostics was held at the Princeton Plasma Physics Laboratory from 25 to 27 January 1994 under the auspices of the IAEA. This document gives a brief overview of the main results presented at the Workshop, namely: (i) the application of various filtering techniques to overcome noise from density fluctuations at the cut-off surface; (ii) detailed measurements of the edge density profile using two frequency, differential phase reflectometry yielding relatively unambiguous density profiles over a 20 cm interval starting from the edge; (iii) new results on the interpretation of measurements of fluctuation correlation lengths in TFTR data, demonstrating that, when phase fluctuation levels exceed a threshold, the correlation length inferred directly from the phase fluctuations is smaller than the density fluctuation correlation length; (iv) recent results from multifrequency pulse radar reflectometry, showing promise to use time domain reflectometry to accomplish the same task as phase measurements; (v) techniques for obtaining short (100 ps) and ultra-short (1 ps) pulses of radiation to produce a continuous range of frequencies from 50 to 200 GHz; and finally (vi) papers on multidimensional reflectometry theory aiming towards a full two or three dimensional solution of the reflectometry problem
Additional details
Publishing Information
- Journal Title
- Nuclear Fusion
- Journal Volume
- 34
- Journal Issue
- 9
- Journal Page Range
- p. 1283-1288.
- ISSN
- 0029-5515
- CODEN
- NUFUAU
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 26003861
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CORRELATIONS; FLUCTUATIONS; IAEA; MATHEMATICAL MODELS; MEASURING METHODS; MEETINGS; MICROWAVE EQUIPMENT; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA RADIAL PROFILES; REFLECTION; SPATIAL RESOLUTION
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; INTERNATIONAL ORGANIZATIONS; RESOLUTION; VARIATIONS