Published 1985
| Version v1
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Dielectronic recombination measurements on multicharged ions
Description
Coaxial electron beams and multiply charged ion beams are used to study dielectronic recombination. The study includes recombination of boron, carbon and sulfur. 3 refs., 7 figs
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE86002255.Files
17029237.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 11 p.
- Report number
- CONF-8410237--4
Conference
- Title
- Workshop on atomic spectra and collisions in external fields.
- Dates
- 22-23 Oct 1984.
- Place
- Gaithersburg, MD (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17029237
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- BORON IONS; CARBON IONS; CROSS SECTIONS; ELECTRON-ION COLLISIONS; EXPERIMENTAL DATA; KEV RANGE 01-10; MULTICHARGED IONS; RECOMBINATION; RYDBERG STATES; SULFUR IONS
- Descriptors DEC
- ATOMIC IONS; CHARGED PARTICLES; COLLISIONS; DATA; ELECTRON COLLISIONS; ENERGY LEVELS; ENERGY RANGE; EXCITED STATES; INFORMATION; ION COLLISIONS; IONS; KEV RANGE; NUMERICAL DATA