Transformation strain by chemical disordering in silicon carbide
Creators
- 1. Department of Materials Science and Engineering, Ohio State University, Columbus, Ohio 43210 (United States)
Description
Swelling is observed in radiation-induced amorphization of SiC, which can be attributed to both structural and chemical disordering. By first-principles calculations, an attempt is made to separate the two factors by creating complete chemical disorder with no initial structural disorder in a 64-atom supercell. By relaxing all stresses and internal forces, significant transformation strains, both hydrostatic and shear, are observed. The relaxed configurations are found to be metallic. Softening of the bulk modulus is found to correlate closely with volume expansion, regardless of whether the expansion is caused by structural or chemical disordering, or with no disorder at all. It is postulated that partial chemical disordering contributes significantly to the internal residual stresses and macroscopic swelling of amorphous SiC
Additional details
Identifiers
- DOI
- 10.1063/1.1690093;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 95
- Journal Issue
- 11
- Journal Page Range
- p. 6466-6469
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36010363
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; PHYSICAL RADIATION EFFECTS; RESIDUAL STRESSES; SHEAR PROPERTIES; SILICON CARBIDES; STRAIN HARDENING; STRESS RELAXATION; SWELLING
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; DEFORMATION; HARDENING; MECHANICAL PROPERTIES; RADIATION EFFECTS; RELAXATION; SILICON COMPOUNDS; STRESSES
Optional Information
- Notes
- (c) 2004 American Institute of Physics.