Published July 15, 1978 | Version v1
Journal article Metadata-only

Concentration profile determination by PIXE analysis utilizing the variation of beam energy

Creators

  • 1. Kozponti Fizikai Kutato Intezet, Budapest (Hungary)

Description

The applicability of the PIXE method by varying the beam energy for in-depth analysis was investigated. The measurements were carried out on different Al samples containing Zn and Mg, annealed during different time periods. The Zn concentration profiles for samples with different annealing were determined up to 30 μm. The method has a relatively poor depth resolution but its advantages (non-destructive multi-elemental method, applicable for a wide range of elements) make it useful especially in connection with some other profiling methods. (Auth.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods
Journal Volume
153
Journal Issue
2-3
Series
Nucl. Instrum. Methods.
Journal Page Range
553-555
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
10425506
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ALUMINIUM; ANNEALING; ENERGY DEPENDENCE; KEV RANGE 100-1000; MAGNESIUM; MEV RANGE 01-10; PROTON BEAMS; QUANTITY RATIO; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; SURFACES; X-RAY EMISSION ANALYSIS; ZINC
Descriptors DEC
ALKALINE EARTH METALS; BEAMS; CHEMICAL ANALYSIS; DISTRIBUTION; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; KEV RANGE; METALS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RESOLUTION