Published March 1994
| Version v1
Journal article
SIMS-RBS depth profiling of silver-diffused glass systems
- 1. Padua Univ. (Italy). Ist. di Fisica
- 2. Padua Univ. (Italy). Dip. di Ingegneria Meccanica
Description
Both SIMS and RBS techniques are used to obtain smooth accurate concentration profiles of silver diffused into soda-lime glass systems. By a computer simulation, a combination of the two techniques enables more detailed information to be obtained on the silver distribution at a depth of up to several micrometres, and the concentration profiles can be used effectively for testing the reliability of some optical behaviour characterizations of glass waveguiding structures. (Author)
Additional details
Publishing Information
- Journal Title
- Surface and Interface Analysis
- Journal Volume
- 21
- Journal Issue
- 3
- Journal Page Range
- p. 210-212.
- ISSN
- 0142-2421
- CODEN
- SIANDQ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 25048851
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; DEPTH; GLASS; ION IMPLANTATION; MASS SPECTROSCOPY; OPTICAL PROPERTIES; RUTHERFORD SCATTERING; SILVER IONS; SPATIAL DISTRIBUTION; WAVEGUIDES
- Descriptors DEC
- CHARGED PARTICLES; DIMENSIONS; DISTRIBUTION; ELASTIC SCATTERING; IONS; PHYSICAL PROPERTIES; SCATTERING; SIMULATION; SPECTROSCOPY