Published December 1999 | Version v1
Journal article

Study of dose effects on IGBT-type devices subjected to gamma irradiation

Description

In the nuclear power industry, speed control has become a mandatory requirement for induction motors used in the precision handling of dangerous substances. Because of this trend, the control systems of such actuators are now being exposed in service to neutrons and gamma radiation. Use of insulated gate bipolar-type transistors in power stage amplifiers has likewise become unavoidable, since IGBTs ensure better conduction and are less expensive than MOS (metal oxide semiconductor) transistors. As no hardened IGBTs are available on the market, it is necessary to study the radiation responses of the COTS versions of these products. This document describes the characterization tests performed on an IGBT transistor, International Rectifier model IRGP45OUD2. It also provides an analysis of IGBT behavior, using an electrical model and a PSPICE simulator

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
46
Journal Issue
6Pt1
Journal Page Range
p. 1680-1685
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
1999 IEEE Nuclear and Space Radiation Effects Conference
Dates
12-16 Jul 1999
Place
Norfolk, VA (United States)