Study of dose effects on IGBT-type devices subjected to gamma irradiation
Description
In the nuclear power industry, speed control has become a mandatory requirement for induction motors used in the precision handling of dangerous substances. Because of this trend, the control systems of such actuators are now being exposed in service to neutrons and gamma radiation. Use of insulated gate bipolar-type transistors in power stage amplifiers has likewise become unavoidable, since IGBTs ensure better conduction and are less expensive than MOS (metal oxide semiconductor) transistors. As no hardened IGBTs are available on the market, it is necessary to study the radiation responses of the COTS versions of these products. This document describes the characterization tests performed on an IGBT transistor, International Rectifier model IRGP45OUD2. It also provides an analysis of IGBT behavior, using an electrical model and a PSPICE simulator
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 46
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 1680-1685
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 1999 IEEE Nuclear and Space Radiation Effects Conference
- Dates
- 12-16 Jul 1999
- Place
- Norfolk, VA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 31021761
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S22: GENERAL STUDIES OF NUCLEAR REACTORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GAMMA RADIATION; JUNCTION TRANSISTORS; PHYSICAL RADIATION EFFECTS; POWER AMPLIFIERS; RADIATION DOSES; REACTOR CONTROL SYSTEMS
- Descriptors DEC
- AMPLIFIERS; CONTROL SYSTEMS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; IONIZING RADIATIONS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS