Published 2007
| Version v1
Journal article
Application of back-reflection topographic methods for identification of dislocations in 6H and 4H SiC crystals
- 1. Institute of Electronic Materials Technology, Warsaw (Poland)
- 2. Institute of Atomic Energy, Otwock-Swierk (Poland)
- 3. Faculty of Physics, Warsaw University of Technology, Warsaw (Poland)
- 4. Hasylab at DESY, Hamburg (Germany)
Description
no abstract available
Availability note (English)
Also available from //www.synchrotron.org.pl/publ/biulet/vol6.htmlAdditional details
Publishing Information
- Journal Title
- Synchrotron Radiation in Natural Science
- Journal Volume
- 6
- Series
- 4 refs., 2 figs.
- Journal Page Range
- p. 77
- ISSN
- 1644-7190
Conference
- Title
- 7. National Symposium of Synchrotron Users and 1. National Conference on Polish Synchrotron - experimental beamlines
- Acronym
- KSUPS-7
- Dates
- 24-26 Sep 2007
- Place
- Poznan (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 39064342
- Subject category
- S36: MATERIALS SCIENCE; S58: GEOSCIENCES;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- CARBON COMPOUNDS; MEETINGS; SILICON CARBIDES; SILICON COMPOUNDS; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CARBIDES; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; RADIATIONS; SCATTERING; SILICON COMPOUNDS
Optional Information
- Contract/Grant/Project number
- Grant no. 3 T10C 022 29
- Funding organization
- State Committee for Scientific Research (Poland)