Published 1995 | Version v1
Miscellaneous

Application of XPS spectroscopy for investigations of conducting polymers surface modified by metals and/or metal complexes

  • 1. Polska Akademia Nauk, Warsaw (Poland). Inst. Chemii Fizycznej

Description

Short communication. 6 refs

Part of:
Abstracts of 3. Seminar Surface and Thin Layer Structures subject

Additional details

Additional titles

Original title (English)
3. Seminarium Powierzchnia i Struktury Cienkowarstwowe. Streszczenia.
Augmented title (English)
XPS means X-ray photoemission spectroscopy

Publishing Information

Publisher
Instytut Technologii Elektronowej.
Imprint Place
Warsaw (Poland)
Imprint Title
Abstracts of 3. Seminar Surface and Thin Layer Structures
Imprint Pagination
116 p.
Journal Page Range
p. 48.

Conference

Title
3. Seminar on Surface and Thin Layer Structures.
Original Conference Title
3. Seminarium Powierzchnia i Struktury Powierzchniowe
Dates
23-26 Oct 1995.
Place
Spala (Poland).

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
28080285
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract, Non-conventional Literature
Descriptors DEI
COMPLEXES; ELECTRIC CONDUCTIVITY; MEETINGS; METALS; PHOTOELECTRON SPECTROSCOPY; POLYMERS; SURFACE PROPERTIES
Descriptors DEC
ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELEMENTS; PHYSICAL PROPERTIES; SPECTROSCOPY

Optional Information

Notes
Imprint:3. Seminarium Powierzchnia i Struktury Cienkowarstwowe. Streszczenia.