Secondary electrons spectrometer with angular resolution for studying the surfaces of monocrystals

A spectrometer on the basis of an electrostatic dispersion energy analyzer is described. The spectrometer is intended for studying orientation effects in interactions of mean energy electrons with monocrystals involving the diffraction of both primary and secondary electrons in near-surface layers of a solid. When studying the primary electron diffraction, their orientation relative to the crystal lattice changes and scattered electrons escaping normally to the surface are analyzed. During the secondary electron diffraction investigation the orientation of the primary beam relative to the crystal is fixed and the current of secondary electrons escaping at different angles is measured. The energy resolution of the analyzer is 0.4%. The angular resolution of the instrument in the plane of polar angle change is <= 2 deg. It is concluded that the instrument high sensitivity permits to investigate the Auger electron spectra in small space angle