Microwave dielectric properties of layered Mg0.93Ca0.07TiO3-(Ca0.3Li0.14Sm0.42)TiO3 ceramics
Creators
Description
Microwave dielectric properties of the layered functionally graded materials (FGMs) ceramics with Mg0.93Ca0.07TiO3 (MCT) and (Ca0.3Li0.14Sm0.42)TiO3 (CLST) were investigated as a function of sintering times at 1350 deg. C. The stable and uniform interfaces of the FGMs specimens were confirmed by X-ray diffraction and SEM photographs study. As a sintering time increased, Qf values of the FGMs specimens were decreased, whereas dielectric constants of the specimens did not changed remarkably. The change of Qf values could be attributed to the compositional inhomogeneity at the interfacial region resulted from the active ionic diffusion. From the EPMA work, active diffusion of Mg2+ (r=0.72 Angst) and Ti4+ (r=0.605 Angst) was detected in the interface of FGMs specimens with an increase of sintering time
Additional details
Identifiers
- PII
- S0254058402002857;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 79
- Journal Issue
- 2-3
- Journal Page Range
- p. 239-242
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37054438
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALCIUM COMPOUNDS; CERAMICS; DIFFUSION; INTERFACES; LITHIUM COMPOUNDS; MAGNESIUM COMPOUNDS; MAGNESIUM IONS; MICROWAVE RADIATION; PERMITTIVITY; SAMARIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SINTERING; TITANATES; TITANIUM IONS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; IONS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.