Published October 2015
| Version v1
Journal article
Irradiation effects in oxide dispersion strengthened (ODS) Ni-base alloys for Gen. IV nuclear reactors
- 1. Faculty of Engineering, Hokkaido University, Kita 13, Nishi 8, Kita-ku, Sapporo, Hokkaido 060-8628 (Japan)
- 2. Institute of Advanced Energy, Kyoto University, Gokasho, Uji, Kyoto 611-0011 (Japan)
Description
Oxide particle dispersion strengthened (ODS) Ni-base alloys are irradiated by using simulation technique (Fe/He dual-ion irradiation) to investigate the reliability to Gen. IV high-temperature reactors. The fine oxide particles with less than 10 nm in average size and approximately 8.0 × 1022 m−3 in number density remained after 101 dpa irradiation. The tiny helium bubbles were inside grains, not at grain-boundaries; it is advantageous effect of oxide particles which trap the helium atoms at the particle-matrix interface. Ni-base ODS alloys demonstrated their great ability to overcome He embrittlement.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2015.06.057Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2015.06.057;
- PII
- S0022-3115(15)30081-7;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 465
- Journal Page Range
- p. 835-839
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48034515
- Subject category
- S36: MATERIALS SCIENCE; S22: GENERAL STUDIES OF NUCLEAR REACTORS;
- Descriptors DEI
- ATOMS; BUBBLES; DENSITY; DISPERSIONS; EMBRITTLEMENT; GRAIN BOUNDARIES; HELIUM; IONS; IRON; IRRADIATION; NICKEL BASE ALLOYS; NUCLEAR INDUSTRY; OXIDES; PARTICLES; RELIABILITY; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHARGED PARTICLES; ELEMENTS; FLUIDS; GASES; INDUSTRY; METALS; MICROSTRUCTURE; NICKEL ALLOYS; NONMETALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE GASES; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.