Preparation of Cu-doped MF aerogels by γ-ray irradiation induced reduction method
Creators
- 1. Science and Technology on Plasma Physics Laboratory, Research Center of Laser Fusion, CAEP, Mianyang (China)
- 2. School of Materials Science and Engineering, Southwest University of Science and Technology, Mianyang (China)
- 3. Institute of Nuclear Physics and Chemistry, CAEP, Mianyang (China)
Description
Cu-doped MF aerogels were successfully synthesized by γ-ray irradiation induced reduction method with different total irradiation doses, which has been confirmed by XRD, ICP-AES and SEM-EDS. The SEM graphs indicate that the reduction of Cu particles in the MF aerogels is small, and they do not reunite in 100 kGy and 200 kGy total irradiation doses. While in higher total irradiation dose (larger than 200 kGy), the reduced Cu will form the metal reunion area in the MF aerogels. The nitrogen adsorption data analysis shows that the specific surface area and the absorption capacity of MF aerogels decrease after Cu doping, which means that Cu particles fill part of the mesopore and micropore of MF aerogels. The content of Cu in the MF aerogels after irradiation is increasing with a increasing total irradiation dose. Besides, at the same irradiation dose rate, different total irradiation doses will affect the contents and morphology of Cu in MF aerogels. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- High Power Laser and Particle Beams
- Journal Volume
- 26
- Journal Issue
- 2
- Journal Page Range
- [6 p.]
- ISSN
- 1001-4322
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49058171
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ADSORPTION; AUGER ELECTRON SPECTROSCOPY; DATA ANALYSIS; DOPED MATERIALS; DOSE RATES; GAMMA RADIATION; GELS; GRAPH THEORY; IRRADIATION; NITROGEN; PARTICLES; RADIATION DOSES; REDUCTION; SCANNING ELECTRON MICROSCOPY; SPECIFIC SURFACE AREA; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMICAL REACTIONS; COHERENT SCATTERING; COLLOIDS; DATA PROCESSING; DIFFRACTION; DISPERSIONS; DOSES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; IONIZING RADIATIONS; MATERIALS; MATHEMATICS; MICROSCOPY; NONMETALS; PHYSICAL PROPERTIES; PROCESSING; RADIATIONS; SCATTERING; SORPTION; SPECTROSCOPY
Optional Information
- Notes
- 3 figs., 2 tabs., 15 refs.; http://dx.doi.org/10.3788/HPLPB201426.022013