Published April 21, 1997
| Version v1
Journal article
A telescope with microstrip gas chambers for the detection of charged products in heavy-ion reactions
Creators
- 1. Istituto Nazionale di Fisica Nucleare, Legnaro (Italy). Lab. Nazionali di Legnaro
- 2. Ist. Nazionale di Fisica Nucleare, Sezione di Trieste and Dipt. di Fisica dell'Univ. (Italy)
- 3. Ist. Nazionale di Fisica Nucleare, Sezione di Milano (Italy)
- 4. Ist. Nazionale di Fisica Nucleare, Sezione di Bologna and Dipt. di Fisica dell'Univ. (Italy)
- 5. Ist. Nazionale di Fisica Nucleare, Firenze (Italy)
- 6. Dipt. di Fisica dell'Univ., Padova (Italy)
- 7. Ist. Nazionale di Fisica Nucleare, Sezione di Bologna (Italy)
Description
Prototypes of a ΔE-E telescope, designed to detect and identify with low-energy threshold both light charged particles and heavy fragments, are described. They are based on a gas drift chamber which conveys primary ionization electrons on gas microstrip devices where multiplication occurs and the energy loss signals are generated. Silicon detectors or Csl(Tl) crystals operate as residual energy detectors. The prototypes were tested both with a source and heavy ion beams. Performances, mainly related to energy resolution, charge identification and angle resolution, are reported. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 389
- Journal Issue
- 3
- Journal Page Range
- p. 474-478.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 28062102
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; DRIFT CHAMBERS; ELECTRON DRIFT; ENERGY LOSSES; ENERGY RESOLUTION; ION DETECTION; PARTICLE IDENTIFICATION; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; TELESCOPE COUNTERS; TOWNSEND DISCHARGE
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRIC DISCHARGES; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS