Published June 2001
| Version v1
Journal article
The new progress of XAFS study at BSRF. Total reflection XAFS method
Creators
- 1. Chinese Academy of Science, Beijing (China). Inst. of High Energy Physics
Description
Total reflection XAFS method is an important aspect in XAFS study, and can be applied to the study of surface and interface structure of materials. To develop this experimental system is one of the projects carried out at XAFS station in BSRF. The goniometer for sample, and important device, has been made and the whole experimental system is under commissioning at the present stage. The mechanical structure of the goniometer, the configuration of the experimental system, the scheme for setting up the system and the primary result are described. Also the application for total reflection XAFS and DAFS with this system are briefly discussed in this paper
Additional details
Additional titles
- Augmented title (English)
- The XAFS is stated for X-ray Absorption Fine Structure. The BSRF is stated for Beijing Synchrotron Radiation Facility
Publishing Information
- Journal Title
- Journal of China University of Science and Technology
- Journal Volume
- 31
- Journal Issue
- 3
- Journal Page Range
- p. 299-301
- ISSN
- 0253-2778
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 35033205
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; FINE STRUCTURE; GONIOMETERS; INTERFACES; PHYSICAL RADIATION EFFECTS; PLATINUM; REFLECTION; SURFACES; SYNCHROTRON RADIATION SOURCES; TEST FACILITIES; X RADIATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; PLATINUM METALS; RADIATION EFFECTS; RADIATION SOURCES; RADIATIONS; SORPTION; SPECTROSCOPY; TRANSITION ELEMENTS