Graphitic structure formation in ion implanted polyetheretherketone
- 1. Chemical Committee, Surface Chemical Analysis, Standards (Australia)
- 2. Creative Polymers Pty. Ltd., 41 Wilkinson Street, Toowoomba, Queensland 4350 (Australia)
- 3. Centre for Microscopy and Microanalysis, University of Queensland, St. Lucia, Queensland 4072 (Australia)
- 4. Center for Applied Science and Engineering, Missouri State University, 524 North Boonville Avenue, Springfield, MO 65806 (United States)
Description
Ion implantation is a technique that is used to change the electrical, optical, hardness and biocompatibility of a wide range of inorganic materials. This technique also imparts similar changes to organic or polymer based materials. With polymers, ion implantation can produce a carbon enriched volume. Knowledge as to the nature of this enrichment and its relative concentration is necessary to produce accurate models of the physical properties of the modified material. One technique that can achieve this is X-ray photoelectron spectroscopy. In this study the formation of graphite like structures in the near surface of polyetheretherketone by ion implantation has been elucidated from detailed analysis of the C 1s and valence band peak structures generated by X-ray photoelectron spectroscopy. Further evidence is given by both Rutherford backscatter spectroscopy and elastic recoil detection.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.06.060Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.06.060;
- PII
- S0169-4332(13)01160-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 283
- Journal Page Range
- p. 154-159
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46003601
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DETECTION; ENRICHMENT; GRAPHITE; GRAPHITIZATION; HARDNESS; ION BEAMS; ION IMPLANTATION; NITROGEN IONS; ORGANIC MATTER; PHYSICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; POLYMERS; RECOILS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTRA; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BEAMS; CARBON; CHARGED PARTICLES; ELECTRON SPECTROSCOPY; ELEMENTS; IONS; MATTER; MECHANICAL PROPERTIES; MINERALS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; RADIATION EFFECTS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.