Published November 9, 1984 | Version v1
Patent

Mass spectrometer with great luminosity

Description

In this spectrometer, the aperture aberrations in the radial plane are corrected, together with the inclination in the image plane. The correction is made by acting, at least, on three parameters: curvature radii of the magnetic sector input and output sides and an hexapole set between the magnetic sector and the image plane; this means, during the development, resolving a three equation system in which variables are the three parameters. Application to every spectrometer is possible

Availability note (English)

Available from Institut National de la Propriete Industrielle, Paris (France).

Abstract (French)

Dans ce spectrometre les aberrations d'ouverture dans le plan radial sont corrigees, de meme que l'inclinaison dans le plan image. La correction se fait en agissant au moins sur trois parametres: les rayons de courbure des faces d'entree et de sortie du secteur magnetique du spectrometre et un sextupole dispose entre le secteur magnetique et le plan image; ceci revient, lors de la mise au point, a resoudre un systeme de trois equations dans les variables sont les trois parametres. L'application a tous les spectrometres de masse est possible

Additional details

Additional titles

Original title (French)
Spectrometre de masse a grande luminosite

Publishing Information

Imprint Pagination
11 p.
IPC:
Int. Cl. H01j49/42.
IPC
Int. Cl. H01j49/42.
Patent number
FR patent document 2545651/A/

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
16064991
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CHROMATIC ABERRATIONS; HEXAPOLAR CONFIGURATIONS; INCLINATION; LUMINOSITY; MAGNETS; MASS SPECTROMETERS
Descriptors DEC
CLOSED CONFIGURATIONS; EQUIPMENT; MAGNETIC FIELD CONFIGURATIONS; MEASURING INSTRUMENTS; MULTIPOLAR CONFIGURATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SPECTROMETERS

Optional Information

Secondary number(s)
FR patent application 8307360.