Published February 2016 | Version v1
Journal article

A novel sandwich differential capacitive accelerometer with symmetrical double-sided serpentine beam-mass structure

  • 1. College of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha (China)

Description

This paper presents a novel differential capacitive silicon micro-accelerometer with symmetrical double-sided serpentine beam-mass sensing structure and glass–silicon–glass sandwich structure. The symmetrical double-sided serpentine beam-mass sensing structure is fabricated with a novel pre-buried mask fabrication technology, which is convenient for manufacturing multi-layer sensors. The glass–silicon–glass sandwich structure is realized by a double anodic bonding process. To solve the problem of the difficulty of leading out signals from the top and bottom layer simultaneously in the sandwich sensors, a silicon pillar structure is designed that is inherently simple and low-cost. The prototype is fabricated and tested. It has low noise performance (the peak to peak value is 40 μg) and μg-level Allan deviation of bias (2.2 μg in 1 h), experimentally demonstrating the effectiveness of the design and the novel fabrication technology. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/26/2/025005

Additional details

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
26
Journal Issue
2
Journal Page Range
[10 p.]
ISSN
0960-1317
CODEN
JMMIEZ

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47079459
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCELEROMETERS; BEAMS; BONDING; GLASS; LAYERS; MANUFACTURING; MASS; PEAKS; RESPIRATORS; SENSORS; SERPENTINE; SIGNALS; SILICON
Descriptors DEC
ELEMENTS; FABRICATION; JOINING; MEASURING INSTRUMENTS; MINERALS; SEMIMETALS; SILICATE MINERALS