Published February 1995 | Version v1
Journal article Metadata-only

Measurement of diffuse X-ray scattering on a three-crystal X-ray diffractometer

Creators

  • 1. Moscow Institute of Steel and Alloys (Russian Federation)

Description

Computer simulation for certain instrumental conditions is used to show the effect of geometrical (instrumental) experimental conditions on the determined exponent n describing the fall in the intensity of diffuse scattering as a function of the scattering vector q. A slit monochromator and analyzer are preferable for reducing the indicated effect

Additional details

Publishing Information

Journal Title
Industrial Laboratory
Journal Volume
60
Journal Issue
8
Journal Page Range
p. 473-477.
ISSN
0019-8447
CODEN
INDLAP

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28011464
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Translation
Descriptors DEI
COMPUTERIZED SIMULATION; GERMANIUM; SCATTERING; SEMICONDUCTOR MATERIALS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELEMENTS; MATERIALS; MEASURING INSTRUMENTS; METALS; SIMULATION

Optional Information

Notes
Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 60: No. 8, 28-32(Aug 1994).