Comparison of diode voltage and ion energy for an intense pulsed ion-beam diode
- 1. Naval Research Laboratory, Washington, DC
Description
A comparison is made of the voltage applied to an intense pulsed ion-beam diode and the energy of deuterons emitted from the diode. The authors measured the energy of deuterons from diodes operating at peak voltages ranging from 0.5 to 1.5 MV. The deuteron energy is determined by neutron time-of-flight (TOF) using d-d neutrons. Deuterons from a CD2-coated anode bombard a thin CD2 target located at the cathode to produce neutrons which are detected at 00. Measured voltage and ion current traces are used to calculate the neutron TOF trace. The deuteron energy is determined by adjusting the magnitude of the voltage so that the calculated TOF trace agrees temporarily with the measured trace. Peak deuteron energy is determined to a precision of 5 to 10% for a flight path of 7.7m. The diode voltage is deduced from a capacitive voltmeter with an inductive correction for the difference between the voltmeter and diode locations
Additional details
Publishing Information
- Publisher
- IEEE.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- 1983 IEEE international conference on plasma science
- Journal Page Range
- p. 33-34.
Conference
- Title
- IEEE international conference on plasma science.
- Dates
- 25-27 May 1983.
- Place
- San Diego, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17075395
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANODES; CATHODES; D-D REACTORS; DEUTERIUM COMPOUNDS; DEUTERON BEAMS; ELECTRIC POTENTIAL; ENERGY RANGE; ION SOURCES; NEUTRONS; PERFORMANCE; THERMIONIC DIODES; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- BARYONS; BEAMS; DIODE TUBES; ELECTRODES; ELECTRON TUBES; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HYDROGEN COMPOUNDS; ION BEAMS; NUCLEONS; THERMIONIC TUBES; THERMONUCLEAR REACTORS
Optional Information
- Notes
- Imprint:Abstracts only.